Our systems to analyse residual stress states SIREX application examples:Contact Us How can we help you? Laser-info@pvatepla.comMetrology Systems LaserSIRD Stress Measurement SIRD…
TechnologiesOur MarketsSemiconductor Packaging Separation of the components located on the wafer; packaging into the various types of casings High importance of adhesion of the plastics used …
SIRD Stress Measurement SIRD (Scanning InfraRed Depolarization) system is a transmission dark-field plane polariscope. When the machine is in use, a fixed-position, linear polarized laser beam…
Residual stress states are “fingerprints” that give an insight into the formation or use of a material or component. Their analysis is essential, for example in order to identify local stress…
Contract Measurement At our application laboratory in Jena, we perform measurements on wafers and component structures made from various materials (Si, GaAs, GaN, SiC, InP, etc.) at the request…
At our application laboratory in Jena, we perform measurements on wafers and component structures made from various materials (Si, GaAs, GaN, SiC, InP, etc.) at the request of our customers. To…
